IIT Bombay Releases Admission Schedule For CEED, UCEED 2020

The Indian Institute of Technology, Bombay has released the schedule for the UCEED and CEED 2020 Admissions.

As per the schedule, the registration process for the Common Entrance Exam for Design (CEED) and Undergraduate Common Entrance Exam for Design (UCEED), will begin on October 09, 2019.

UCEED is conducted for admission to the Bachelor of Design programmes offered at IIT Bombay, Guwahati, Hyderabad and IITDM Jabalpur. CEED is conducted for the admissions to the Masters of Design and the PhD programmes in Design offered at IISC Bangalore, IIT Bombay, Delhi, Guwahati, Hyderabad, Kanpur and IITDM Jabalpur.

Interested candidates can visit the official websites to complete the registration and application process online.

http://www.uceed.iitb.ac.in

Candidates can also click here for details.

Important dates to remember:

  • Candidates will be able to submit their application without late fee until November 09, 2019.
  • Candidates can submit their registration with a late fee from November 10 to 16, 2019.
  • The Admit Cards for the exam will be released for download from January 01, 2020 onwards.
  • Candidates will also be given a chance to make corrections in the admit card.
  • The last date for rectification of discrepancies in the admit card is January 05, 2020.
  • UCEED and CEED  2020 Exams will be conducted on January 18, 2020.

UCEED will be conducted for a duration of three hours in two parts.

CEED 2020 will be conducted in the computer-based mode which will evaluate the students’ visualization and spatial ability, environmental and social awareness, analytical and logical reasoning, language and creativity, observation and design sensitivity.

The examination will be divided into two parts. Part A will contain numerical answer questions, multiple select questions and multiple-choice questions. Only those candidates who qualify in Part A will be able to appear for Part B.

As per the notification, IIT Bombay has introduced a few changes in the examination pattern for both the exams.

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