Registration For JEE Advanced Mock Test to Begin Tomorrow
Qualified candidates can enroll themselves for the mock test to prepare well for the final exam by registering at jeeadv.ac.in
NEW DELHI: Indian Institute of Technology, Kanpur has made available the link for JEE Advanced mock test ahead of the JEE Advanced, scheduled for May 18.
Qualified candidates can register for the mock test on the official website, jeeadv.ac.in and appear for the practice test.
The online registration for JEE (Advanced) 2025 for the candidates who qualified JEE (Main) 2025 will start from 10 am on April 23 and close at 11:59 pm on May 2. The last date for fee payment of registered candidates is May 5.
As per the JEE Advanced exam pattern 2025, there will be two papers—Paper I & Paper II. Candidates need to appear for both papers. The paper I and II will be conducted on the same day and their duration will be 3 hours each.
How to register for JEE Advanced mock test
Step 1: Visit the official website, jeeadv.ac.in
Step 2: Locate ‘Resources’ tab on the home page. Under it, check the section titled ‘Practice Test for JEE Advance 2025’
Step 3: Select paper 1 or paper 2 for practising mock test based on your preference
Step 4: Start the test to familiarise yourself with the interface and pattern.
For direct link to appear for the mock test, click here.
Students can download the admit card for JEE Advance from May 11 to 18. The final answer key and results will be announced on June 2.
JEE Main Result 2025
National Testing Agency announced the Joint Entrance Exam Main (JEE Main) session 2 result on April 19. Ayush Singhal topped the exam by achieving All India Rank 1 in JEE Main exam.
In the April 2025 Session 2 of JEE Main Paper 1, a total of 9,92,350 candidates appeared for the exam, including 6,81,871 females and 3,10,479 males. Among them, the General category had the highest number of candidates at 3,72,675 (2,50,849 females and 1,21,826 males), followed by the OBC category with 3,74,860 candidates (2,58,274 females and 1,16,586 males).
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